ACIS flight detectors are fabricated of high-resistivity silicon (
-cm)
to maximize depletion depth and, therefore, high-energy X-ray detection
efficiency. The devices are three-side-abuttable to minimize inter-chip
gaps in the flight focal plane. Flight CCDs have been fabricated in both
front-illuminated and back-illuminated configurations. Other characteristics
of the detectors are listed in Table 4.1.
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