List of Figures

• Ordering of the elements of the PHAS and BIAS Vectors
• CHIP vs. READ coordinates
• Which pixels are which in READ coordinates for each output node.
• Layout of the ACIS CCDID 17 detector
• Cross-section through a front-illuminated CCD
• Principal components of the CCD spectral response function
• ACIS ground calibration flow.
• Linear Energy Scale Residuals for the Front Illuminated Devices
• Linear Energy Scale Residuals for the Back Illuminated Devices
• Average FWHM versus Energy
• Histogram of the CCD response to 1700 eV X-rays.Centroid of the low energy peak as a function of energy.
• Ratio of Low Energy Peak to Primary Peak vs. Energy
• Potential distribution in the buried channel CCD.
• Histogram of the CCD response to 5414 eV X-rays.
• Scheme of forming low energy tail from the electron clouds generated close to Si-SiO₂ interface.
• Fraction of single pixel events in tail as a function of characteristic absorption length in silicon.
• Cloud radius in silicon as a function of energy.
• Response of the CCD to 1700 eV photons and the model prediction.
• Response of the CCD to 1870 eV photons and the model prediction.
• Response of the CCD to 2015 eV photons and the model prediction.
• Response of the CCD to 4510 eV photons and the model prediction.
• Possible redistributions of detected x-rays due to pileup
• Regions of CCD for pileup model
• Relation between Detected & Incident Flux for  = 4 x 10^-5
• Raw K-alpha HEXS Pileup Data for Al, Si, & P
• Raw K-alpha HEXS Pileup Data for Cl, Ti, & V
• Raw K-alpha HEXS Pileup Data for Fe, Co, & Ni
• Raw K-alpha HEXS Pileup Data for Cu, Zn, & Ge
• Raw Full Spectrum HEXS Pileup Data for Al, Si, P, Cl, Ti, & V
• Raw Full Spectrum HEXS Pileup Data for Fe, Co, Ni, Cu, Zn, & Ge
• Mean g02346  with no Spectral correction (Al - V)
• Mean g02346 with no Spectral correction (Fe - Ge)
• Variation of with Si Penetration depth
• Variation of Alpha (Al - V)
• Variation of Alpha (Fe - Ge)
• Variation of spectrally averaged epsilon () for Al to V
• Variation of spectrally averaged epsilon ($\epsilon ^{'}$) for Fe to Ge
• Mean g02346 epsilon for all data sets including a spectral correction (Al - V)
• Mean g02346 epsilon for all data sets including a spectral correction (Fe - Ge)
• Variation of epsilon including corrections for spectral impurities
• Redistribution of G02346 Events due to Pileup (Al - V)
• Redistribution of G02346 Events due to Pileup (Fe - Ge)
• Branching ratio epsilons from data set for elements Al - V
• Branching ratio epsilons from data set for elements Fe - Ge
• Gate structure of a CCD.
• SEM measurement of a channel stop
• Schematic of the mesh showing its orientation to the CCD
• Fixture used to hold the mesh close to the CCD surface
• Left:  Moire pattern; Right:  Representative pixel
• Five parameter channel stop model.
• Variation in detection efficiency due to the channel stop
• Chi-squared Contour Plots for Channel Stop Parameters
• Best-fit HEXS channel stop model compared to experimental data.
• Intensity of grade 0 events at O K
• O K Representative Pixels for grade 0, 2, 3 and 4, and 6 events
• HRMA Encircled Energy Projected onto Sub-pixel Locations
• Sketch of the PTB laboratory
• White Light & BESSY Spectra vs. Height above Orbital Plane
• w190c3, quad B: BESSY data vs. model
• w190c1,quad A: BESSY data vs. model
• w103c4, quad B: BESSY data vs. model
• BESSY absolute efficiencies vs. CSR relative efficiencies for w190c3 & w103c4
• Schematic of the CCD depleted layers.
• Exponential distribution of the number of interacting photons as a function of distance from the surface.
• Histograms of different grades for Fe⁵⁵ X-rays. Eight panels (from top to bottom) correspond to ASCA grades 0 through 7.
• Charge collected in the center pixel from the Fe⁵⁵ photon landing in the neutral bulk as a function of distance from depletion region boundary.
• Cross section of the thin film sample.
• Transmission of the thin SiO₂ film as a function of energy (solid line). Dotted line represents standard Henke data.
• Transmission of the sandwich (solid line).
• Absorption of the thin films of polysilicon (solid line), silicon dioxide (dotted line) , and SiO₂ - Si₃N₄ (dashed line) sandwich.
• Transmission of the oxidized polysilicon film (solid line) and result of the best fit to it of the product of the polysilicon and SiO₂ transmissions (dotted line).
• Quantum efficiency of the frontside illuminated CCD. Dashed line is the result of the QE measurement at SX700 line at BESSY.
• Quantum efficiency of the backside illuminated CCD. Triangles mark experimental results from SX700 at BESSY.
• Telemetry and High Speed Tap Spectra
• Telemetry, High Speed Tap, and Difference Light Curves
• Best-fit model quantum efficiency for all ACIS FI Detectors
• Relative Detection Efficiency of FI & BI CCDs vs. Energy
• Uniformity Maps of Quantum Efficiency:  I0
• Uniformity Maps of Quantum Efficiency:  I1
• Uniformity Maps of Quantum Efficiency:  I2
• Uniformity Maps of Quantum Efficiency:  I3
• Uniformity Maps of Quantum Efficiency:  S0
• Uniformity Maps of Quantum Efficiency:  S2
• Uniformity Maps of Quantum Efficiency:  S4
• Uniformity Maps of Quantum Efficiency:  S5
• Uniformity Maps of Quantum Efficiency:  S1
• Uniformity Maps of Quantum Efficiency:  S3
• O-K Spectra from S3 & S2 from XRCF Phase I
• O-K Spectra from S3 & S2 from Subassembly Calibration
• Ti-K Spectra from S3 & S2 from XRCF Phase I
• Ti-K Spectra from S3 & S2 from Subassembly Calibration
• Best-estimates for ACIS S2 Detector Quantum Efficiency
• Best-fit model quantum efficiency for all ACIS FI Detectors
• Adopted ACIS S1 (Back-illuminated) Detector Quantum Efficiency Model
• Adopted ACIS S3 (Back-illuminated) Detector Quantum Efficiency Model
• Comparison of XRCF Phase I relative Quantum Efficiency Measurements to Model Predictions for FI Detectors
• Ratio of Quantum Efficiency for w193c2 with Standard & Reduced Clock Levels
• ACIS gain variation as a function of DEA temperature.
• Difference in Gain Measured at XRCF-FF and ISIM-TV1
• ACIS dark current data at T = -40$\mbox{$^{\circ}$ }$ C.
• ACIS dark current data at T = -60$\mbox{$^{\circ}$ }$ C.
• ACIS dark current data at T = -90$\mbox{$^{\circ}$ }$ C.
• Post cold soak ACIS dark current data at T = -90 C.
• Background Spectra Measured at XRCF in FI Flight Devices
• Background Spectra at XRCF in S3
• Cross-section through ACIS Housing, Showing ICM X-ray Source
• FI chip response to the ICM spectrum in the range 0-1 keV.
• BI chip response to the ICM spectrum in the range 0-1 keV.
• FI chip response to the ICM spectrum in the range 1-7 keV.
• BI chip response to the ICM spectrum in the range 1-7 keV.
• FI chip response to the ICM spectrum in the range 7-15.5 keV
• BI chip response to the ICM spectrum in the range 7-18 keV
• Illumination pattern of Mn K  events from the ICM as measured at XRCF-I
• Contour map of ICM Mn K events from three different measurements.
• ExtCalSrc spectrum (0-7 keV) on S2 from a 4  9.2 ks integration
• Relative Intensity map of ExtCalSrc Al K
• Relative Intensity map of ExtCalSrc Ti K
• Relative Intensity map of ExtCalSrc Mn KACIS Responsivity at 660 nm as measured at the Lincoln Laboratory Thermal Vacuum Test
• Focal Plane Composite Images for Light Leak Tests
• Dark Current Map Showing Exposure to 5.9 keV Photons
• CTI vs. Accumulated Ionizing Dose for FI CCD
• Dark Current for FI Device Before & After Flight on STS-85
• Dark Current for BI Device Before & After Flight on STS-85
• Cross section of the gate structure of the CCD along the transfer channel.
• Cross section of the gate structure of the CCD perpendicular to the transfer channel.
• Detected Events as a Function of Coordinate within a Single Pixel (525 eV)
• Detected Events as a Function of Coordinate within a Single Pixel (539 eV)
• Intensity of Escape & Flourescence Features vs. Energy
• Histogram of the horizontally split events at 1487 eV
• Ratio of the number of events in the shoulder to the total number of events in the horizontally split event histogram
• Standard graded histograms comparing experimental data with simulated data
• Schematic of the test configuration
• Al-K EXAFS with model fit
• C-K EXAFS with model fit
• Imager Filter Transmission Data with Best Fit Model
• Spectrometer Filter Transmission Data with Best Fit Model
• Al-L XAFS.
• C-K XAFS.
• N-K XAFS.
• O-K XAFS.
• X-ray transmission of the ACIS filters in the 0.05-3keV band.
• A fit of optical tranmission model to measured optical transmission of an aluminized polyimide sample
• Real part of refractive index for polyimide.
• Predicted transmission for ACIS I OBF for angles of 0, 30 and 60
• Predicted transmission for ACIS S OBF for angles of 0, 30 and 60
• Predicted transmission for ACIS I OBF for diffuse illumination
• Predicted transmission for ACIS S OBF for diffuse illumination
• Transmission of Spectrometer filter above the Al-K absorption edge at 20 and -60 C
• Imaging Array Filters 009 and 019
• Spectroscopy Array Filter 003
• OBF Transmission vs. Energy Based on SRC Data
• Effective Area vs. Energy & Grade for CCD I1
• Effective Area vs. Energy & Grade for CCD ID7
• I1 Energy Resolution vs. Grade
• S3 Energy Resolution vs. Grade
• I1 Effective Area vs. Split Threshold
• S3 Effective Area vs. Split Threshold
• I1 Energy Resolution vs. Split Threshold
• S3 Energy Resolution vs. Split Threshold
• Effective Area of ACIS/HEG with Grades
• Simulation of ACIS/HEG Spectrum of NGC 4151
• Improvement in Spectral Resolution by Grade Selection
• Spectrum of PSF spot in H-IAI-CR-1.001
• Scatter Plot of rays in H-IAI-CR-1.001
• Binned image of data & model for H-IAI-CR-1.001
• 2-D histogram ("lego plot") of H-IAI-CR-1.001
• Data and simulation images of H-IAI-CR-1.001
• Difference image of data & model for H-IAI-CR-1.001
• 2-D histogram ("lego plot") for H-IAI-CR-1.001 data & model
• Horizontal and vertical cuts through centroid
• Marginal sums of PSF for data & model
• ACIS Flight Focal Plane
• Projecting rays on ACIS:  Plane of CCD Orthogonal to HRMA Axis
• Projecting rays on ACIS:  Plane of CCD Tilted to HRMA Axis
• Single-pixel event position probability distribution
• Two-pixel event position probability distribution
• Three-pixel (L-shaped) event position probability distribution
• Four-pixel (square-shaped) event position probability distribution
• Radial distortion map for one pixel
• Correlation of FAM Y,Z to ACIS Y,Z
• Correlation Coefficient of Subpixel Position of FAM vs. ACIS
• Pileup Correction - Gaussian Method
• Pileup Correction - ROI Method
• Pileup Fraction vs. Counts/Frame
• CCD Pileup Correction - All Grades Included
• Pileup fraction vs. incident flux - Chip I3
• Pileup fraction vs. incident flux - Chip S3
• Comparison of McNamara pileup model to Phase H data
• Comparison of MARX pileup model to Phase H data
• Al K Spectrum taken in continuous Clocking Mode
• Flux Limit for 1% Pileup vs. Off-axis Angle
• Pile-up Mitigation Mask
• In-band events with PSF core excluded
• Masking & efficiency reduction required to achieve quality metric of 90%
• Grade-filtered piled-up spectra with and without masking
• Flux proxies for seven simulations
• Cross section of two CCD pixels
• Fraction of X-ray Flux within Central Pixel vs. Energy
• Radiation Damage from Blackbody Spectrum Source
• Radiation Damage from Power Law Spectrum Source
• Radiation Damage from Collisional Equilibrium Spectrum Source
• Radiation Damage from Thermal Bremsstrahlung Spectrum Source
• Example of a simulated back-illuminated CCD frame, containing 1000 1keV photon events and 10 particle events
• Example of a simulated front-illuminated CCD frame, containing 1000 1keV photon events and 10 particle events
• Tuning parameters for CCDSIM
• Spectrum of XRCF Phase I data.
• Spectrum of simulated data, tuned to match the above test.
• ACIS Fitted Peak vs. Incident Energy
• Gaussian fits to models just above and below Si K edge
• Event Browser Light Curve
• Event Browser Spectrum
• Event Browser Image
• Event Browser Spatial Filter
• Event Browser Property/Property Filter
• 3x3 Event Grading Illustration
• FITS keywords in Penn State ACIS simulator parameter file
• Ordering of PHAS vector
• PSF of AXAF Mirrors at 450 nm
• Encircled Energy of AXAF Mirrors at 450 nm
• Encircled Energy of AXAF Mirrors at 850 nm
• Optical Transmission of MEG Facet
• Optical Transmission of HEG Facet