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Instrument Team Calibration
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of Tables
List of Figures
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Ordering
of the elements of the PHAS and BIAS Vectors
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CHIP
vs. READ coordinates
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Which
pixels are which in READ coordinates for each output node.
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Layout of the ACIS CCDID
17 detector
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Cross-section through a
front-illuminated CCD
-
Principal components of the CCD spectral
response function
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ACIS
ground calibration flow.
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Linear
Energy Scale Residuals for the Front Illuminated Devices
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Linear
Energy Scale Residuals for the Back Illuminated Devices
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Average
FWHM versus Energy
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Histogram
of the CCD response to 1700 eV X-rays.Centroid
of the low energy peak as a function of energy.
-
Ratio of Low Energy Peak to Primary Peak
vs. Energy
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Potential
distribution in the buried channel CCD.
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Histogram
of the CCD response to 5414 eV X-rays.
-
Scheme
of forming low energy tail from the electron clouds generated close to
Si-SiO2
interface.
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Fraction
of single pixel events in tail as a function of characteristic absorption
length in silicon.
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Cloud
radius in silicon as a function of energy.
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Response
of the CCD to 1700 eV photons and the model prediction.
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Response
of the CCD to 1870 eV photons and the model prediction.
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Response
of the CCD to 2015 eV photons and the model prediction.
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Response
of the CCD to 4510 eV photons and the model prediction.
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Possible
redistributions of detected x-rays due to pileup
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Regions
of CCD for pileup model
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Relation between Detected & Incident
Flux for
= 4 x 10-5
-
Raw K-alpha HEXS Pileup Data for Al, Si,
& P
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Raw K-alpha HEXS Pileup Data for Cl, Ti,
& V
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Raw K-alpha HEXS Pileup Data for Fe, Co,
& Ni
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Raw K-alpha HEXS Pileup Data for Cu, Zn,
& Ge
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Raw Full Spectrum HEXS Pileup Data for
Al, Si, P, Cl, Ti, & V
-
Raw Full Spectrum HEXS Pileup Data for
Fe, Co, Ni, Cu, Zn, & Ge
-
Mean g02346
with
no Spectral correction (Al - V)
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Mean g02346
with
no Spectral correction (Fe - Ge)
-
Variation of
with
Si Penetration depth
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Variation of Alpha (Al - V)
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Variation of Alpha (Fe - Ge)
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Variation
of spectrally averaged epsilon (
)
for Al to V
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Variation
of spectrally averaged epsilon (
)
for Fe to Ge
-
Mean
g02346 epsilon for all data sets including a spectral correction (Al -
V)
-
Mean
g02346 epsilon for all data sets including a spectral correction (Fe -
Ge)
-
Variation
of epsilon including corrections for spectral impurities
-
Redistribution of G02346 Events due to
Pileup (Al - V)
-
Redistribution of G02346 Events due to
Pileup (Fe - Ge)
-
Branching
ratio epsilons from data set for elements Al - V
-
Branching
ratio epsilons from data set for elements Fe - Ge
-
Gate
structure of a CCD.
-
SEM
measurement of a channel stop
-
Schematic
of the mesh showing its orientation to the CCD
-
Fixture
used to hold the mesh close to the CCD surface
-
Left: Moire pattern; Right:
Representative pixel
-
Five
parameter channel stop model.
-
Variation
in detection efficiency due to the channel stop
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Chi-squared Contour Plots for Channel
Stop Parameters
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Best-fit
HEXS channel stop model compared to experimental data.
-
Intensity of grade 0 events at O
K

-
O K
Representative Pixels for grade 0, 2, 3 and 4, and 6 events
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HRMA Encircled Energy Projected onto
Sub-pixel Locations
-
Sketch
of the PTB laboratory
-
White Light & BESSY Spectra vs.
Height above Orbital Plane
-
w190c3,
quad B: BESSY data vs. model
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w190c1,quad
A: BESSY data vs. model
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w103c4,
quad B: BESSY data vs. model
-
BESSY absolute efficiencies vs. CSR
relative efficiencies for w190c3 & w103c4
-
Schematic
of the CCD depleted layers.
-
Exponential
distribution of the number of interacting photons as a function of distance
from the surface.
-
Histograms
of different grades for Fe55 X-rays. Eight panels (from
top to bottom) correspond to ASCA grades 0 through 7.
-
Charge
collected in the center pixel from the Fe55 photon landing
in the neutral bulk as a function of distance from depletion region boundary.
-
Cross
section of the thin film sample.
-
Transmission
of the thin SiO2 film as a function of energy (solid
line). Dotted line represents standard Henke data.
-
Transmission
of the sandwich (solid line).
-
Absorption
of the thin films of polysilicon (solid line), silicon dioxide (dotted
line) , and SiO2 - Si3N4
(dashed line) sandwich.
-
Transmission
of the oxidized polysilicon film (solid line) and result of the best fit
to it of the product of the polysilicon and SiO2 transmissions
(dotted line).
-
Quantum
efficiency of the frontside illuminated CCD. Dashed line is the result
of the QE measurement at SX700 line at BESSY.
-
Quantum
efficiency of the backside illuminated CCD. Triangles mark experimental
results from SX700 at BESSY.
-
Telemetry
and High Speed Tap Spectra
-
Telemetry,
High Speed Tap, and Difference Light Curves
-
Best-fit
model quantum efficiency for all ACIS FI Detectors
-
Relative Detection Efficiency
of FI & BI CCDs vs. Energy
-
Uniformity Maps of Quantum Efficiency:
I0
-
Uniformity Maps of Quantum Efficiency:
I1
-
Uniformity Maps of Quantum Efficiency:
I2
-
Uniformity Maps of Quantum Efficiency:
I3
-
Uniformity Maps of Quantum Efficiency:
S0
-
Uniformity Maps of Quantum Efficiency:
S2
-
Uniformity Maps of Quantum Efficiency:
S4
-
Uniformity Maps of Quantum Efficiency:
S5
-
Uniformity Maps of Quantum Efficiency:
S1
-
Uniformity Maps of Quantum Efficiency:
S3
-
O-K Spectra from S3 & S2
from XRCF Phase I
-
O-K Spectra from S3 & S2 from
Subassembly Calibration
-
Ti-K Spectra from S3 & S2
from XRCF Phase I
-
Ti-K Spectra from S3 & S2
from Subassembly Calibration
-
Best-estimates for ACIS S2 Detector Quantum
Efficiency
-
Best-fit model quantum efficiency for
all ACIS FI Detectors
-
Adopted
ACIS S1 (Back-illuminated) Detector Quantum Efficiency Model
-
Adopted
ACIS S3 (Back-illuminated) Detector Quantum Efficiency Model
-
Comparison of XRCF Phase I relative
Quantum Efficiency Measurements to Model Predictions for FI Detectors
-
Ratio of Quantum Efficiency for w193c2
with Standard & Reduced Clock Levels
-
ACIS
gain variation as a function of DEA temperature.
-
Difference
in Gain Measured at XRCF-FF and ISIM-TV1
-
ACIS
dark current data at T = -40
C.
-
ACIS
dark current data at T = -60
C.
-
ACIS
dark current data at T = -90
C.
-
Post
cold soak ACIS dark current data at T = -90
C.
-
Background Spectra Measured at XRCF
in FI Flight Devices
-
Background Spectra at XRCF in S3
-
Cross-section through ACIS Housing,
Showing ICM X-ray Source
-
FI
chip response to the ICM spectrum in the range 0-1 keV.
-
BI
chip response to the ICM spectrum in the range 0-1 keV.
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FI
chip response to the ICM spectrum in the range 1-7 keV.
-
BI
chip response to the ICM spectrum in the range 1-7 keV.
-
FI
chip response to the ICM spectrum in the range 7-15.5 keV
-
BI
chip response to the ICM spectrum in the range 7-18 keV
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Illumination
pattern of Mn K
events from the ICM as measured at XRCF-I
-
Contour
map of ICM Mn K
events from three different measurements.
-
ExtCalSrc spectrum (0-7 keV) on S2 from a 4
9.2 ks integration
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Relative Intensity map of ExtCalSrc Al
K

-
Relative Intensity map of ExtCalSrc Ti
K

-
Relative Intensity map of ExtCalSrc Mn
K
ACIS
Responsivity at 660 nm as measured at the Lincoln Laboratory Thermal Vacuum
Test
-
Focal Plane Composite Images for
Light Leak Tests
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Dark Current Map Showing Exposure
to 5.9 keV Photons
-
CTI vs. Accumulated Ionizing Dose
for FI CCD
-
Dark Current for FI Device Before &
After Flight on STS-85
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Dark Current for BI Device Before &
After Flight on STS-85
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Cross
section of the gate structure of the CCD along the transfer channel.
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Cross
section of the gate structure of the CCD perpendicular to the transfer
channel.
-
Detected Events as a Function of Coordinate
within a Single Pixel (525 eV)
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Detected Events as a Function of Coordinate
within a Single Pixel (539 eV)
-
Intensity of Escape & Flourescence
Features vs. Energy
-
Histogram
of the horizontally split events at 1487 eV
-
Ratio
of the number of events in the shoulder to the total number of events in
the horizontally split event histogram
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Standard
graded histograms comparing experimental data with simulated data
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Schematic of the test configuration
-
Al-K
EXAFS with model fit
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C-K
EXAFS with model fit
-
Imager Filter Transmission Data with Best
Fit Model
-
Spectrometer Filter Transmission Data
with Best Fit Model
-
Al-L
XAFS.
-
C-K
XAFS.
-
N-K
XAFS.
-
O-K
XAFS.
-
X-ray
transmission of the ACIS filters in the 0.05-3keV band.
-
A fit of optical tranmission model to
measured optical transmission of an aluminized polyimide sample
-
Real
part of refractive index for polyimide.
-
Predicted transmission for ACIS I OBF
for angles of 0, 30 and 60
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Predicted transmission for ACIS S OBF
for angles of 0, 30 and 60
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Predicted transmission for ACIS I OBF
for diffuse illumination
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Predicted transmission for ACIS S OBF
for diffuse illumination
-
Transmission of Spectrometer filter above
the Al-K absorption edge at 20 and -60
C
-
Imaging Array Filters 009 and 019
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Spectroscopy Array Filter 003
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OBF Transmission vs. Energy Based on SRC
Data
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Effective
Area vs. Energy & Grade for CCD I1
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Effective
Area vs. Energy & Grade for CCD ID7
-
I1
Energy Resolution vs. Grade
-
S3
Energy Resolution vs. Grade
-
I1
Effective Area vs. Split Threshold
-
S3
Effective Area vs. Split Threshold
-
I1
Energy Resolution vs. Split Threshold
-
S3
Energy Resolution vs. Split Threshold
-
Effective Area of ACIS/HEG with Grades
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Simulation of ACIS/HEG Spectrum of NGC 4151
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Improvement in Spectral Resolution by
Grade Selection
-
Spectrum of PSF spot in H-IAI-CR-1.001
-
Scatter Plot of rays in H-IAI-CR-1.001
-
Binned image of data & model for
H-IAI-CR-1.001
-
2-D histogram ("lego plot") of
H-IAI-CR-1.001
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Data and simulation images of H-IAI-CR-1.001
-
Difference image of data & model for
H-IAI-CR-1.001
-
2-D histogram ("lego plot") for H-IAI-CR-1.001
data & model
-
Horizontal and vertical cuts through centroid
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Marginal sums of PSF for data &
model
-
ACIS
Flight Focal Plane
-
Projecting
rays on ACIS: Plane of CCD Orthogonal to HRMA Axis
-
Projecting rays on ACIS: Plane
of CCD Tilted to HRMA Axis
-
Single-pixel
event position probability distribution
-
Two-pixel
event position probability distribution
-
Three-pixel
(L-shaped) event position probability distribution
-
Four-pixel
(square-shaped) event position probability distribution
-
Radial
distortion map for one pixel
-
Correlation
of FAM Y,Z to ACIS Y,Z
-
Correlation
Coefficient of Subpixel Position of FAM vs. ACIS
-
Pileup Correction - Gaussian
Method
-
Pileup Correction - ROI Method
-
Pileup Fraction vs. Counts/Frame
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CCD Pileup Correction - All
Grades Included
-
Pileup fraction vs. incident
flux - Chip I3
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Pileup fraction vs. incident
flux - Chip S3
-
Comparison of McNamara pileup
model to Phase H data
-
Comparison of MARX pileup model
to Phase H data
-
Al K
Spectrum taken in continuous Clocking Mode
-
Flux Limit for 1% Pileup vs. Off-axis
Angle
-
Pile-up
Mitigation Mask
-
In-band events with PSF core excluded
-
Masking & efficiency reduction required
to achieve quality metric of 90%
-
Grade-filtered piled-up spectra with
and without masking
-
Flux
proxies for seven simulations
-
Cross section of two CCD pixels
-
Fraction of X-ray Flux within Central
Pixel vs. Energy
-
Radiation Damage from Blackbody Spectrum
Source
-
Radiation Damage from Power Law Spectrum
Source
-
Radiation Damage from Collisional Equilibrium
Spectrum Source
-
Radiation Damage from Thermal Bremsstrahlung
Spectrum Source
-
Example
of a simulated back-illuminated CCD frame, containing 1000 1keV photon
events and 10 particle events
-
Example
of a simulated front-illuminated CCD frame, containing 1000 1keV photon
events and 10 particle events
-
Tuning parameters for CCDSIM
-
Spectrum
of XRCF Phase I data.
-
Spectrum
of simulated data, tuned to match the above test.
-
ACIS Fitted Peak vs. Incident Energy
-
Gaussian fits to models just above
and below Si K edge
-
Event
Browser Light Curve
-
Event
Browser Spectrum
-
Event
Browser Image
-
Event
Browser Spatial Filter
-
Event
Browser Property/Property Filter
-
3x3
Event Grading Illustration
-
FITS
keywords in Penn State ACIS simulator parameter file
-
Ordering
of PHAS vector
-
PSF of AXAF Mirrors at 450 nm
-
Encircled Energy of AXAF Mirrors
at 450 nm
-
Encircled Energy of AXAF Mirrors
at 850 nm
-
Optical Transmission of MEG Facet
-
Optical Transmission of HEG Facet
Please address comments and questions to Dr. John Nousek ( nousek@astro.psu.edu
)