Here we describe an obvious technique suitable for isolated point sources: Since pile-up is related to the surface brightness of the incident photon distribution, an event's position in the source PSF is related to the probability that the event is corrupted. So, one can reduce pile-up effects to any desired level by discarding a sufficient number of events from the PSF core.
We choose to discard events by applying a circular mask centered on
the PSF, as depicted in Figure 6.41.
Our investigation explores the relationships between the photon flux level,
the size of the mask, and the magnitude of the spectral distortion remaining
in the unmasked events. Since both the CCD behavior and the AXAF PSF are
energy dependent, we simulated on-axis (aimpoint of the I-array) monochromatic
point sources at three different energies - Oxygen (525 eV), Aluminum (1.49
keV), and Copper (8.03 keV).
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