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Up: ACIS XRCF Measurement Plan
Previous: Count-Rate Linearity
The Spatial Linearity tests consist of moving the PSF across chips to determine that
the desired motion converts properly from the spatial domain to the CCD
pixel domain. Also look for PSF variation indicating that the CCD chips
are tilted with respect to the HRMA axis.
Spatial Linearity Tests
| TRW-ID |
Source |
Energy |
FP_Rate, Tot_cts |
Int Time |
Mult |
Pitch |
Yaw |
Yoff |
Zoff |
Defocus |
Focal |
HST |
Frametime |
Proc_mode |
rows |
frames |
| H-IAI-SL-1.001 |
O-Ka |
0.5249 |
5.7696,1730.88 |
1900 |
1 |
0 |
0 |
0 |
0 |
0 |
I3 |
I3 |
3.3 |
PH_CNT |
1024 |
576 |
| H-IAS-SL-1.002 |
O-Ka |
0.5249 |
5.6467,1694.01 |
900 |
1 |
0 |
0 |
0 |
0 |
0 |
S3 |
S3 |
3.3 |
PH_CNT |
1024 |
273 |
Please address comments and questions to Dr. John Nousek ( nousek@astro.psu.edu )